专题：Electron and X-Ray Spectroscopy Techniques

This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.
最新文献
Defining the nature of adventitious carbon and improving its merit as a charge correction reference for XPS

article Full Text OpenAlex

Detecting dynamic structural evolution based on in-situ high-energy X-ray diffraction technology for sodium layered oxide cathodes

article Full Text OpenAlex

Functional underlayers, surface priming, and multilayer stacks to improve dose and adhesion of EUV photoresists

article Full Text OpenAlex

Optimizing the band alignment of p-Si based heterojunction photocathode for photoelectrochemical hydrogen production

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Advanced characterization of 2D materials using SEM image processing and machine learning

article Full Text OpenAlex

Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data

article Full Text OpenAlex

Graphene in cryo-EM specimen optimization

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Scanning Electron Microscopy Imaging of Large DNA Molecules Using a Metal‐Free Electro‐Stain Composed of DNA‐Binding Proteins and Synthetic Polymers

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Time-resolved cryogenic electron tomography for the study of transient cellular processes

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New Poisson denoising method for pulse-count STEM imaging

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近5年高被引文献
LAMMPS - a flexible simulation tool for particle-based materials modeling at the atomic, meso, and continuum scales

article Full Text OpenAlex 9216 FWCI488.20561611

DeepEMhancer: a deep learning solution for cryo-EM volume post-processing

article Full Text OpenAlex 1255 FWCI367.64410315

Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy

article Full Text OpenAlex 1091 FWCI69.83247866

New tools for automated cryo-EM single-particle analysis in RELION-4.0

article Full Text OpenAlex 1000 FWCI279.49076571

Recent advances and applications of deep learning methods in materials science

article Full Text OpenAlex 880 FWCI108.4873715

A step-by-step guide to perform x-ray photoelectron spectroscopy

article Full Text OpenAlex 681 FWCI74.16594748

The same chemical state of carbon gives rise to two peaks in X-ray photoelectron spectroscopy

article Full Text OpenAlex 592 FWCI46.15576756

Origin of structural degradation in Li-rich layered oxide cathode

article Full Text OpenAlex 548 FWCI58.882756

Review on surface-characterization applications of X-ray photoelectron spectroscopy (XPS): Recent developments and challenges

article Full Text OpenAlex 518 FWCI56.41403935

Multi-particle cryo-EM refinement with M visualizes ribosome-antibiotic complex at 3.5 Å in cells

article Full Text OpenAlex 480 FWCI155.5886094