专题：Electron and X-Ray Spectroscopy Techniques

This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.
最新文献
Materials Graph Library (MatGL), an open-source graph deep learning library for materials science and chemistry

article Full Text OpenAlex

Probing Domain-Boundary-Induced Structural Degradation in Single-Crystalline LiCoO2 by Nanoscale Imaging

article Full Text OpenAlex

Automated Assembly Modelling of Metal‐Organic Polyhedra

article Full Text OpenAlex

Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing

article Full Text OpenAlex

Characterizing laser-heated polymer foams with simultaneous x-ray fluorescence spectroscopy and Thomson scattering at the Matter in Extreme Conditions Endstation at LCLS

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Quantitative study of oxidation mechanism in photoelectrochemical mechanical polishing of difficult-to-process semiconductor wafers

article Full Text OpenAlex

MicroscopyGPT: Generating Atomic-Structure Captions from Microscopy Images of 2D Materials with Vision-Language Transformers

article Full Text OpenAlex

Phase Imaging Methods in the Scanning Transmission Electron Microscope

review Full Text OpenAlex

DeepEM Playground: Bringing deep learning to electron microscopy labs

article Full Text OpenAlex

Surface effects in x-ray absorption spectra of lanthanides: Focus on strongly correlated cerium materials

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近5年高被引文献
LAMMPS - a flexible simulation tool for particle-based materials modeling at the atomic, meso, and continuum scales

article Full Text OpenAlex 7771 FWCI415.316

DeepEMhancer: a deep learning solution for cryo-EM volume post-processing

article Full Text OpenAlex 1091 FWCI63.012

Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy

article Full Text OpenAlex 936 FWCI60.787

New tools for automated cryo-EM single-particle analysis in RELION-4.0

article Full Text OpenAlex 863 FWCI47.383

Recent advances and applications of deep learning methods in materials science

article Full Text OpenAlex 735 FWCI59.182

A step-by-step guide to perform x-ray photoelectron spectroscopy

article Full Text OpenAlex 610 FWCI52.636

The same chemical state of carbon gives rise to two peaks in X-ray photoelectron spectroscopy

article Full Text OpenAlex 561 FWCI40.497

Origin of structural degradation in Li-rich layered oxide cathode

article Full Text OpenAlex 481 FWCI44.518

Accessing the robustness of adventitious carbon for charge referencing (correction) purposes in XPS analysis: Insights from a multi-user facility data review

article Full Text OpenAlex 448 FWCI38.005

Review on surface-characterization applications of X-ray photoelectron spectroscopy (XPS): Recent developments and challenges

article Full Text OpenAlex 427 FWCI36.36