专题：Electron and X-Ray Spectroscopy Techniques

This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.
最新文献
Deep-learning methods for contrast enhancement and artifact reduction in cryo-electron tomography: a systematic analysis of the state of the art and proposed improvements

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Handbook of Electronic Devices and Materials

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Integrated fluorescence light microscopy-guided cryo-focused ion beam-milling for in situ montage cryo-ET

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Ultrathin liquid cells for microsecond time-resolved cryo-EM

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Quantitative analyses by combined energy and wavelength dispersive spectrometry: The best of both worlds

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Unveiling fine structure and energy-driven transition of photoelectron Kikuchi diffraction

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Protocol for Mouse Brain and SH-SY5Y Cell Sample Preparation for Electron Microscopy v1

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In Situ Liquid‐Cell Transmission Electron Microscopy Insights Into Lithium‐Ion Battery Materials Degradation: Challenges and Emerging Solutions

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Quantum simulation of electron energy loss spectroscopy for battery materials

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SmartEM: machine learning-guided electron microscopy

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近5年高被引文献
Recent advances and applications of deep learning methods in materials science

article Full Text OpenAlex 974 FWCI68.9333

A step-by-step guide to perform x-ray photoelectron spectroscopy

article Full Text OpenAlex 715 FWCI55.6719

Origin of structural degradation in Li-rich layered oxide cathode

article Full Text OpenAlex 601 FWCI51.9885

Review on surface-characterization applications of X-ray photoelectron spectroscopy (XPS): Recent developments and challenges

article Full Text OpenAlex 583 FWCI43.0229

A Bayesian approach to single-particle electron cryo-tomography in RELION-4.0

article Full Text OpenAlex 331 FWCI69.1878

3DFlex: determining structure and motion of flexible proteins from cryo-EM

article Full Text OpenAlex 286 FWCI76.9151

X-ray photoelectron spectroscopy of thin films

article Full Text OpenAlex 286 FWCI32.3707

Referencing to adventitious carbon in X-ray photoelectron spectroscopy: Can differential charging explain C 1s peak shifts?

article Full Text OpenAlex 277 FWCI21.1052

Peak-fitting of Cu 2p photoemission spectra in Cu0, Cu1+, and Cu2+ oxides: A method for discriminating Cu0 from Cu1+

article Full Text OpenAlex 276 FWCI31.2803

AreTomo: An integrated software package for automated marker-free, motion-corrected cryo-electron tomographic alignment and reconstruction

article Full Text OpenAlex 272 FWCI55.7014